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X-ray Diffraction Laboratory

SCIENTIFIC & TECHNICAL SERVICES

X-ray Diffraction Laboratory

An X-ray diffraction laboratory and XRD service for structural and microstructural characterization of crystalline materials, powders, thin films and functional materials.

Structural information for crystalline materials

The X-ray Diffraction Laboratory is a consolidated ICMAB scientific service. Its main objective is to support the different departments of the institute while also being available to external scientific users.

Based on X-ray diffraction principles, the service provides structural and microstructural information about crystalline materials. In materials science, understanding structure and composition is essential for interpreting properties and performance.

The XRD service offers fast, accurate and customised data collection, qualitative and quantitative phase analysis, texture measurements, residual stress, reciprocal space maps, microdiffraction and thin film diffraction.

Main XRD capabilities

A scientific platform for X-ray diffraction data acquisition and analysis under multiple geometries, sample formats and experimental conditions.

  • Powder diffraction

    Standard powder diffraction, qualitative and quantitative phase analysis for crystalline materials.

  • Thin films

    Thin film diffraction, X-ray reflectometry, grazing incidence diffraction and reciprocal space maps.

  • Texture & stress

    Texture measurements, pole figures, residual stress analysis and microstructural characterization.

  • Microdiffraction

    Microdiffraction, X-Y mapping, capillary measurements and customized XRD data collection.

Laboratory environment

The original XRD slideshow is preserved as a visual overview of the laboratory equipment and working environment.

  • X-ray Diffraction Laboratory

    SCIENTIFIC & TECHNICAL SERVICES

  • X-ray Diffraction Laboratory

    SCIENTIFIC & TECHNICAL SERVICES

  • X-ray Diffraction Laboratory

    SCIENTIFIC & TECHNICAL SERVICES

  • X-ray Diffraction Laboratory

    SCIENTIFIC & TECHNICAL SERVICES

  • X-ray Diffraction Laboratory

    SCIENTIFIC & TECHNICAL SERVICES

Diffractometers and measurement configurations

The laboratory includes Bruker X-ray diffraction instruments for powder diffraction, thin film analysis, high-resolution diffraction, capillary measurements, microdiffraction, texture and stress analysis.

  • Bruker D8 Advance A25 Powder

    The Bruker D8 Advance A25 Powder a powder diffractometer well suited for the analysis of powder samples and qualitative analysis.

    The specifications of this diffractometer are:

    • Cu radiation tube
    • Dynamic beam optimization (DBO)
    • Sample autochanger for 90 samples
    • Lynxeye XE-T detector

    The applications for this diffractometer are:

    • Standard powder diffraction

  • Bruker D8 Advance (GADDS)

    This unit is equipped with a centric Eulerian cradle and a VANTEC-500 area detector. This combination gives the Bruker D8 the capability to handle tasks such as phase identification and quantification, textural and residual stress analysis, determination of particle size, percent crystallinity, and structural identification.

    It has these specifications:

    • Cu radiaton tube
    • Göbel Mirror
    • Collimator (0,5 mm, 0,3 mm, 0,1 mm)
    • XYZ stage
    • Vantec 500 Area Detector.

    The applications for this diffractometer are:

    • Standard Microdiffraction analysis
    • Stress analysis
    • Texture analysis
    • X-Y mapping of flat samples

  • Bruker D8-Discover

    The D8 DISCOVER is an X-ray diffraction instrument, perfect for thin film application, equipped with four motorized axes stage, having as typical applications: XR Reflectometry, Rocking measurements, RSM measurements and structural phase identification. The equipment can works in two differents configurations, Bragg-Brentano and Parallel configuration. 

    The specifications of this diffractometer are:

    • Centric Eulerian Cradle
    • Twin Cu radiaton tube (lineal or point beam)
    • Göbel Mirror 600mm length
    • 2-Bounce monochromator Acc2 (Ge022) primary monochromator
    • Knife Edge Collimator 
    • Lynxeye XE-T Detector
    • Pathfinder 1-Bounce (Ge022) secondary monochromator with scintillation dectector
    • XYZ stage
    • Tilt Stage with Xi Zeta angles

    The applications for this difractometer are:

    • High-resolution X-ray diffraction
    • X-ray reflectometry
    • Grazing incidence diffraction (GID)
    • Stress analysis
    • Texture analysis
    • X-Y mapping of flat samples
    • Standard powder diffraction

  • Bruker D8 Advance A25

    The D8 Advance A25 is equipped by two different configurations, Bragg-Brentano geometry with electrochemical cell (Cu radiation) and Debye-Scherrer geometry (Mo radiation) with a Johansson monochromator for capillary measurements.

    The specifications are:

    • Cu radiation tube for electro-chemical cell
    • Mo radiaton tube for capillary
    • Johanson primary monochromator for Mo radiation
    • Electro-chemical cell
    • Lynxeye XE-T detector
    • Capillary sample stage
    • Powder sample stage
    • Powder mutliple sample

    The applications for this diffractometer are:

    • Standar powder diffraction
    • Capillary diffraction
    • Transmission standard diffraction

XRD analysis software

Specialised software supports phase identification, quantitative phase analysis, structure analysis, texture analysis, thin film analysis and residual stress studies.

  • Powder diffraction software

    EVA – Phase identification and quantitative phase analysis
    TOPAS – Profile analysis, quantitative analysis and structure analysis

  • Materials research software

    MULTEX – Texture analysis
    LEPTOS – Thin film analysis and residual stress

Request Service

To request XRD measurements, download and complete the service request sheet. The service team can help define the most suitable configuration according to sample type, geometry and scientific question.

Download request form

Request service sheet

Download request form

  • 1

    Request
    Download and complete the XRD request form.

  • 2

    Sample
    Define sample type, geometry and measurement needs.

  • 3

    Configuration
    Select suitable diffractometer and setup.

  • 4

    Measurement
    Collect X-ray diffraction data under required conditions.

  • 5

    Analysis
    Receive data, phase analysis or technical feedback.

X-ray Diffraction Laboratory team

Technical staff and scientists in charge supporting XRD data collection, analysis and materials characterization workflows.

Technicians

Scientists in charge

Contact X-ray Diffraction Laboratory

ICMAB
Campus UAB
In front of Firehouse
08193 Bellaterra
Barcelona, Spain

E-mail

Phone

41.5020,2.1102

ICMAB - X-ray Diffraction Laboratory

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Thin Films Laboratory

SCIENTIFIC & TECHNICAL SERVICES

Thin Films Laboratory

A thin films deposition service for complex oxide thin films, metallic layers and heterostructures using pulsed laser deposition and sputtering technologies.

Thin film deposition for complex oxides and heterostructures

The Thin Films Laboratory offers researchers the capability to fabricate complex oxide thin films and heterostructures combining oxides and metals.

The service is based on pulsed laser deposition (PLD) for oxides and sputtering for metals, supporting advanced materials research, device-oriented studies and the optimisation of deposition conditions for new materials.

PLD is a physical vapour deposition technique that uses ultraviolet laser radiation to vaporize material from a target and transfer it to a substrate under controlled vacuum and atmosphere conditions.

Main laboratory capabilities

A deposition service for high-quality thin films, epitaxial oxide layers and metal/oxide heterostructures for advanced materials research.

  • Pulsed Laser Deposition

    PLD for complex oxides, epitaxial films and fast optimisation of deposition conditions.

  • Sputtering

    Metal deposition and integration with oxide thin film workflows and heterostructures.

  • Heterostructures

    Fabrication of multilayer architectures combining oxides and metals for advanced devices.

  • Materials research

    Support for research groups working with functional oxides, thin films and device-oriented materials.

Equipment and deposition technologies

The laboratory includes PLD set-ups and sputtering capabilities designed for oxide and metal thin films deposition.

The technique is very suitable for oxides, and compared with other techniques is particularly useful to obtain films with complex stoichiometry and to grow epitaxial films and heterostructures. Moreover, PLD is highly versatile to optimize the deposition conditions of new materials, and the films can be grown in relatively fast processes. These characteristics favour the use of the technique by research groups having interest in different materials.

The pulsed beam of an ultraviolet laser (usually an excimer) is focused on a ceramic target placed in a vacuum chamber. The combination of pulsed irradiation, high photon energy, and high energy density can cause the ablation of the material. Ablation refers to the etching and emission of material under conditions totally out of the equilibrium. The plasma created expands fast along the perpendicular direction of the target (see the photography in Figure 2). A substrate is placed front the target, and inert or reactive gases are usually introduced during the deposition process.

From target ablation to functional thin films

PLD enables the growth of complex stoichiometry films and epitaxial heterostructures through controlled laser ablation, plasma expansion and deposition on substrates.

  • 1

    Target
    Select ceramic or metallic target.

  • 2

    Laser ablation
    UV laser vaporizes the target material.

  • 3

    Plasma plume
    Material expands towards the substrate.

  • 4

    Deposition
    Film grows under controlled atmosphere.

  • 5

    Optimisation
    Conditions are tuned for material quality.

Request Service

Contact the Thin Films Laboratory team to discuss deposition needs, material system, target and substrate requirements, expected film structure and feasibility of the experiment.

The original page includes PLD service contact information and dynamic staff contacts, which are preserved below.

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PLD Service

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Thin Films Laboratory team

Technical staff, scientists in charge and user committee members supporting thin film deposition, PLD and sputtering workflows.

Technicians

Scientists in charge

User's Committee

Contact Thin Films Laboratory

ICMAB
Campus UAB
In front of Firehouse
08193 Bellaterra
Barcelona, Spain

E-mail

Phone

41.5020,2.1102

ICMAB - Thin Films Laboratory

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Thermal Analysis Laboratory

SCIENTIFIC & TECHNICAL SERVICES

Thermal Analysis Laboratory

A scientific service for thermal analysis, surface area and porosity studies of advanced materials under controlled temperature, atmosphere and adsorption conditions.

Thermal behaviour, surface area and porosity characterization

The Thermal Analysis Laboratory studies how materials behave when temperature changes under different conditions and atmospheres, and supports surface area and porosity studies.

The service provides simultaneous thermogravimetric analysis and DSC/DTA, differential scanning calorimetry and BET surface area analysis.

It supports ICMAB research groups and scientific users working with advanced functional materials, porous materials, powders, solids, polymers and compounds that require thermal stability, phase transition, mass-loss or adsorption/desorption analysis.

Main laboratory capabilities

A thermal analysis laboratory for studying mass changes, heat flow, phase transitions, thermal stability, decomposition, surface area and porosity.

  • TGA-DSC/DTA

    Simultaneous mass variation and heat-flow / differential thermal analysis as a function of temperature and time.

  • DSC

    Differential scanning calorimetry for phase transitions, fusion, decomposition and thermal events.

  • BET analysis

    Surface area and porosity analysis using nitrogen, argon or carbon dioxide adsorption/desorption.

  • Controlled atmospheres

    Measurements under oxygen, air, argon, diluted hydrogen and other controlled conditions.

Equipment

The service combines thermal analysis instrumentation and BET porosimetry systems for advanced materials characterization.

The Thermal Analysis Service of ICMAB includes two equipments, a simultaneous thermogravimetric analysis (TG)- differential scanning calorimetry/differential thermal analysis (heat flow DSC /DTA) system NETZSCH -STA 449 F1 Jupiter, and a differential scanning calorimeter (power compensation DSC) Perkin Elmer DSC8500 LAB SYS (N5340501) equipped with a Liquid N2 controller CRYOFILL (N534004)

  • Thermal Analysis

    Thermal Analysis

    • NETZSCH -STA 449 F1 Jupiter: Allows for simultaneous thermogravimetric analysis (TG) and differential scanning calorimetry/differential thermal analysis (DSC/DTA).
    • Perkin Elmer DSC8500 LAB SYS (N5340501): A differential scanning calorimeter with DSC power compensation, equipped with a CRYOFILL (N534004) liquid N2
    • Perkin Elmer DSC8000 (N5340511): A differential scanning calorimeter with DSC power compensation, equipped with Intercooler 2 Cooling Accessory (N5374099)
    • Perkin Elmer Pyris 1 TGA Thermogravimetric Analyzer

     

    Read more

  • BET Surface Area Analysis

    BET Surface Area Analysis

    • Micromeritics ASAP 2000 (N2): Accelerated Surface Area and Porosimetry System using nitrogen as adsorption/desorption gas.
    • Micromeritics ASAP 2020 (N2, Ar, CO2): Accelerated Surface Area and Porosimetry System using either nitrogen, argon or carbon dioxide as adsorption/desorption gas.

    Read more

  • BET

    BET

    Read more

Techniques

Thermal analysis techniques provide key information on stability, mass-loss, transitions, reactions and thermal response of materials.

  • TGA-DSC/DTA

    The simultaneous TGA-DSC/DTA analyzer allows the measurement of weight and DSC (heat flow)/DTA (differential thermal analysis) signals as a function of temperature and time. It is used for monitoring chemical reactions, thermal stabilities, solvent evaporation and reduction and oxidation of materials under different gases among other studies. The sensitivity of the balance is 0.07 micrograms. The furnace can operate from room temperature to 1400oC. The analyzer may work in several atmospheres such as oxygen, air, argon and hydrogen (diluted at 5% in Ar), at ambient pressure and with using typical flow rates of 70 cm3/min.

  • DSC

    The differential scanning calorimeter Perkin Elmer (power compensation) measures the energy absorbed and released when a sample is heated, frozen, or kept at constant temperature. Experiments can be made in the range of temperatures between 110 and 950 K. DSC is very useful to determine fusion or decomposition temperatures, phase transitions in crystals and amorphous solids, identification of polymorphs and also permits the identification of the molecular conformations as for example single polymer chain folding among others. With this equipment, very small amount of sample is needed (1-2 mg ) to have reliable results.

Request Service

To request this service, download and complete the relevant form and leave it together with the sample in the closet located on the ground floor. For further information, contact the service technician.

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  • Request Form ATG-DSC-EGA

    To request this service, please fill the application form in the link left and leave it together with the sample in the closet located at in the ground floor. For further information please contact the service technician Roberta Ceravola This email address is being protected from spambots. You need JavaScript enabled to view it.

    Download request form

  • Request Form BET

    To request this service, please fill the application form in the link left and leave it together with the sample in the closet located at in the ground floor. For further information please contact the service technician Roberta Ceravola This email address is being protected from spambots. You need JavaScript enabled to view it.

    Download request form

  • 1

    Select form
    Choose ATG-DSC-EGA or BET.

  • 2

    Prepare request
    Complete the application form.

  • 3

    Submit sample
    Leave form and sample in the ground-floor closet.

  • 4

    Measurement
    Service team performs the required analysis.

  • 5

    Results
    Receive data and technical feedback.

Thermal analysis in practice

A video overview of the laboratory workflow and equipment environment.

Thermal Analysis Laboratory team

Technical staff, scientists in charge and user committee members supporting thermal analysis, DSC, TGA and BET characterization workflows.

Technicians

Scientists in charge

User's Committee

Contact Thermal Analysis Laboratory

ICMAB
Campus UAB
In front of Firehouse
08193 Bellaterra
Barcelona, Spain

E-mail

(Roberta: TGA/DSC, Alejandro: BET)

Phone

41.5020,2.1102

ICMAB - Thermal Analysis Laboratory

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Spectroscopic Techniques Laboratory

SCIENTIFIC & TECHNICAL SERVICES

Spectroscopic Techniques Laboratory

A centralised spectroscopy service for molecular spectroscopy and electron paramagnetic resonance, supporting advanced materials research with FT-IR, UV-Vis-NIR and EPR techniques.

Centralised spectroscopy for advanced materials research

The ICMAB Spectroscopic Techniques Laboratory provides centralised equipment and installations mainly for ICMAB research groups, while also being open to external scientific users.

The service offers high-level technology and quality to support the research lines currently underway at the institute, with equipment for EPR, UV-Vis-NIR and FT-IR spectroscopy.

EPR measurements are supported by highly qualified technical staff, while other equipment is mainly used under a self-service regime after training for internal users.

Main laboratory capabilities

A spectroscopy platform for analytical, physicochemical and molecular characterization of organic, inorganic and paramagnetic materials.

  • FT-IR spectroscopy

    Infrared molecular spectroscopy for powders, films, polymers, liquids and KBr pellet measurements.

  • UV-Vis-NIR spectroscopy

    Absorbance, transmittance and reflectance measurements for liquid and solid samples.

  • EPR spectroscopy

    Electron paramagnetic resonance for transient and stable paramagnetic species and free radicals.

  • User access

    Self-service access for trained internal users and technical support for external users.

Equipment

The laboratory provides FT-IR, UV-Vis-NIR and EPR instrumentation for molecular spectroscopy, diffuse reflectance, temperature-dependent EPR and analytical studies of materials.

  • FTIR

    Spectrophotometer Jasco 4700. Energy range: 300-7800 cm-1.  The Service is provided with a Attenuated Total Reflectance accessory (ATR) for powder samples, films, polymers, liquids, etc. Powder samples can also be measured making KBr pellets.
    This equipment is of self-service management for internal users, who have been previously trained by the technicians. However, the technicians are needed for the external users

  • UV-Vis-NIR

    There are two double beam UV-Vis-NIR spectrophotometer, a by Jasco V-780 and a Jasco V-770 with operational range of 190-3300 nm and also a Shimadzu UV-Vis 1700 spectrophotometer with operational range of 200-800 nm.

    Liquid samples     can be measured in absorbance or transmittance mode mainly using 1 cm or 1 mm quartz cuvettes. The three equipments are of self-service management for internal users, who have been previously trained by the technicians. However, the technicians are needed for the external users.

    For solid samples it is available a Diffuse Reflectance Sphere DRA-2500 accessory in the UV-Vis-NIR Jasco V-770 spectrophotometer, with operational range of 190-3300 nm. Solid samples can be measured mainly in reflectance or transmittance mode.

    A qualified technician is always needed for running the DRA-2500 accessory.

  • EPR

    Bruker ELEXYS E500 X band EPR spectrometer equipped with a variable temperature unit, a field frequency (F/F) lock accessory and built in NMR Gaussmeter. There are different cavities for the different measurements needed. A qualified technician is always needed for running this equipment.

Request Service

Internal users should first contact the service technicians to receive training and access instructions. External users should contact the technical team to define the measurements and complete the corresponding service form.

INTERNAL USERS
First contact with the Service Technicians Víctor Vallejo (This email address is being protected from spambots. You need JavaScript enabled to view it., ext. 436100). They will train the users to manage the equipment by themselves because it works in a self-service regime for internal users.
All users must register in the database registration of the equipment every time they use it, pointing out the time they have spent doing the measurement, the group's IP and the project's number.

EXTERNAL USERS
First contact with the Service Technicians Vega Lloveras (This email address is being protected from spambots. You need JavaScript enabled to view it., ext. 436100) in order to arrange the details of the measurements. At the same time, a service form must be filled in. Every equipment has its own service form. There exists the possibility of working with the apparatus in a self-service regime.
In addition to this, all users must also register in the database of the equipment every time they use it.

  • FT-IR

    Follow the general procedure

    Download service form

  • UV-Vis-NIR

    1. Liquid measurements.
    Follow the general procedure.
    2. Solid measurements using Diffuse Reflectance Sphere (DRA-2500) accessory.
    The technicians are always needed for running the DRA-2500 accessory, for internal as well as for external users. Contact with them (This email address is being protected from spambots. You need JavaScript enabled to view it., ext. 436100) in order to arrange the details of the measurements.

    At the same time, a service form must be filled in.
    In addition to this, all users must also register in the database of the equipment every time they use it.

    Download service form

  • EPR

    First contact with the Service Technician Vega Lloveras (This email address is being protected from spambots. You need JavaScript enabled to view it., ext. 436100) in order to arrange the details of the measurements. At the same time, a service form must be filled in.

    Download service form

  • 1

    Contact
    Contact the service technicians.

  • 2

    Define technique
    Select FT-IR, UV-Vis-NIR or EPR workflow.

  • 3

    Training / form
    Internal users train; external users submit a form.

  • 4

    Measurement
    Use self-service or technician-supported access.

  • 5

    Register use
    Record time, group IP and project number.

Spectroscopic Techniques Laboratory team

Technical staff, scientists in charge and user committee members supporting access to spectroscopic instrumentation and analytical workflows.

Technicians

Scientists in charge

User's Committee

Contact Spectroscopic Techniques Laboratory

ICMAB
Campus UAB
In front of Firehouse
08193 Bellaterra
Barcelona, Spain

E-mail

Phone

41.5020,2.1102

ICMAB - Spectroscopic Techniques Laboratory

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Scanning Probe Microscopy

SCIENTIFIC & TECHNICAL SERVICES

Scanning Probe Microscopy

A scientific service for nanoscale surface characterization using atomic force microscopy, scanning tunneling microscopy and advanced SPM modes for materials science research.

Nanoscale imaging and local surface characterization

The Scanning Probe Microscopy Laboratory offers SPM-related experiments to the ICMAB community and to external scientific users.

The service is open to researchers from research centres, universities, technological centres, spin-offs and industry, including international users and researchers working within the NFFA Europe project initiative.

The laboratory provides access to advanced SPM instrumentation for nanoscale topography, electrical, magnetic and functional characterization of materials and devices.

Main service capabilities

Advanced scanning probe microscopy capabilities for nanoscale surface imaging, local electrical characterization, magnetic contrast and functional materials analysis.

  • AFM imaging

    Contact, tapping, non-contact and dynamic topography modes for nanoscale surface morphology.

  • Functional SPM

    KPFM, EFM, PFM, MFM, FFM and PinPoint AFM for local material properties.

  • STM measurements

    Scanning tunneling microscopy in constant current mode at room temperature and controlled atmosphere.

  • External access

    Open to ICMAB, external users, international researchers and NFFA Europe project users.

Scanning Probe Microscopy equipment

The SPM Lab combines Park System NX10 and Keysight 5500 AFM instrumentation for advanced nanoscale measurements and flexible lock-in based experiments.

Park System NX10

Scanner 

  • 100 μm × 100 μm range in XY
  • 15 μm range in Z

Stage

  • XY stage travel range of  20 mm × 20 mm

Optical microscope

  • Tip possitioning by optical microscopy
  • Field of view: 480 μm × 360 μm
  • 10 × objective lens

Sample mounting

  • Sample size: Open space up to 100 mm x 100 mm, thickness up to 20 mm

4 channels of flexible digital lock-in amplifier

Keysight 5500 AFM

Keysight 5500 has a 90x90 microns in X/Y and 15 microns in the Z axis closed loop scanner. 
The SPM is equipped with three independent Lock-in amplifiers that can be fully configured through the use of an external Signal Access Box.
The equipment can be used with the following modes: 
  • Piezoresponse Force Microscopy
  • Bimodal Atomic Force Microscopy
  • Dynamic Topography.

It also has a Closed Loop capability that significantly improves the positioning in X and Y.

Sample size is limited to 3 x 3 cm in the X and Y directions and 1 cm in the Z direction. 

A Q-Control is also available to enhance images in liquid. 

SPM modes and measurement capabilities

The laboratory supports a broad portfolio of AFM and STM measurement modes for structural, electrical, magnetic and functional characterization.

Atomic Force Microscopy modes

AFM

  • Contact mode
  • Tapping mode
  • Non-contact mode
  • Friction Force Microscopy (FFM)
  • Electrostatic Force Microscopy (EFM)
  • Kelvin Probe Microscopy (KPFM)
  • Piezoresponse Force Microscopy (PFM)
  • PinPoint AFM
  • Magnetic Force Microscopy (MFM)

Scanning Tunneling Microscopy modes

STM

  • Constant current mode
    • RT and controlled atmosphere (N2)

How to request a service

Submit the service request form and the SPM team will contact you to define the measurement needs, sample requirements and access conditions.

You can also contact the laboratory by email for specific questions or special requests.

SERVICE REQUEST FORM

  • 1

    Request
    Submit the service request form.

  • 2

    Contact
    The SPM team reviews your needs.

  • 3

    Feasibility
    Define sample, mode and measurement strategy.

  • 4

    Measurement
    Carry out SPM experiments.

  • 5

    Results
    Receive images, data and technical feedback.

Open for NFFA Europe users

Open for NFFA Project

We are open to possible new requests through the European project NFFA.

Scanning Probe Microscopy team

Technical staff, scientist in charge and user committee members supporting access to SPM instrumentation and nanoscale characterization workflows.

Technicians

Scientist in charge

User's Committee

SPM image gallery

Examples of nanoscale imaging and functional characterization obtained through SPM techniques.

  • Tapping mode - Topography

    Tapping mode - Topography

  • Topography - oxide thin film

  • Magnetic Force Microscopy - hard disc

  • Kelvin Probe Microscopy - KPFM

  • Magnetic Force Microscopy - Phase Shift - LSMO thin film

  • Tapping mode - Topography - Organic fibers

Contact Scanning Probe Microscopy

ICMAB
Campus UAB
08193 Bellaterra
Barcelona, Spain

E-mail

Phone

41.5020,2.1102

ICMAB - Scanning Probe Microscopy

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