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SCIENTIFIC & TECHNICAL SERVICES

Scanning Probe Microscopy

A scientific service for nanoscale surface characterization using atomic force microscopy, scanning tunneling microscopy and advanced SPM modes for materials science research.

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Equipment
SPM Gallery

Nanoscale imaging and local surface characterization

The Scanning Probe Microscopy Laboratory offers SPM-related experiments to the ICMAB community and to external scientific users.

The service is open to researchers from research centres, universities, technological centres, spin-offs and industry, including international users and researchers working within the NFFA Europe project initiative.

The laboratory provides access to advanced SPM instrumentation for nanoscale topography, electrical, magnetic and functional characterization of materials and devices.

Main service capabilities

Advanced scanning probe microscopy capabilities for nanoscale surface imaging, local electrical characterization, magnetic contrast and functional materials analysis.

AFM imaging

Contact, tapping, non-contact and dynamic topography modes for nanoscale surface morphology.

Functional SPM

KPFM, EFM, PFM, MFM, FFM and PinPoint AFM for local material properties.

STM measurements

Scanning tunneling microscopy in constant current mode at room temperature and controlled atmosphere.

External access

Open to ICMAB, external users, international researchers and NFFA Europe project users.

Scanning Probe Microscopy equipment

The SPM Lab combines Park System NX10 and Keysight 5500 AFM instrumentation for advanced nanoscale measurements and flexible lock-in based experiments.

Park System NX10

Scanner 

  • 100 μm × 100 μm range in XY
  • 15 μm range in Z

Stage

  • XY stage travel range of  20 mm × 20 mm

Optical microscope

  • Tip possitioning by optical microscopy
  • Field of view: 480 μm × 360 μm
  • 10 × objective lens

Sample mounting

  • Sample size: Open space up to 100 mm x 100 mm, thickness up to 20 mm

4 channels of flexible digital lock-in amplifier

Keysight 5500 AFM

Keysight 5500 has a 90x90 microns in X/Y and 15 microns in the Z axis closed loop scanner. 
The SPM is equipped with three independent Lock-in amplifiers that can be fully configured through the use of an external Signal Access Box.
The equipment can be used with the following modes: 
  • Piezoresponse Force Microscopy
  • Bimodal Atomic Force Microscopy
  • Dynamic Topography.

It also has a Closed Loop capability that significantly improves the positioning in X and Y.

Sample size is limited to 3 x 3 cm in the X and Y directions and 1 cm in the Z direction. 

A Q-Control is also available to enhance images in liquid. 

SPM modes and measurement capabilities

The laboratory supports a broad portfolio of AFM and STM measurement modes for structural, electrical, magnetic and functional characterization.

Atomic Force Microscopy modes

AFM
  • Contact mode
  • Tapping mode
  • Non-contact mode
  • Friction Force Microscopy (FFM)
  • Electrostatic Force Microscopy (EFM)
  • Kelvin Probe Microscopy (KPFM)
  • Piezoresponse Force Microscopy (PFM)
  • PinPoint AFM
  • Magnetic Force Microscopy (MFM)

Scanning Tunneling Microscopy modes

STM
  • Constant current mode
    • RT and controlled atmosphere (N2)

How to request a service

Submit the service request form and the SPM team will contact you to define the measurement needs, sample requirements and access conditions.

You can also contact the laboratory by email for specific questions or special requests.

SERVICE REQUEST FORM

1

Request
Submit the service request form.

2

Contact
The SPM team reviews your needs.

3

Feasibility
Define sample, mode and measurement strategy.

4

Measurement
Carry out SPM experiments.

5

Results
Receive images, data and technical feedback.

Open for NFFA Europe users

Open for NFFA Project

We are open to possible new requests through the European project NFFA.

Scanning Probe Microscopy team

Technical staff, scientist in charge and user committee members supporting access to SPM instrumentation and nanoscale characterization workflows.

Technicians

Scientist in charge

User's Committee

Contact Scanning Probe Microscopy

ICMAB
Campus UAB
08193 Bellaterra
Barcelona, Spain

E-mail

Phone

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