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SCIENTIFIC & TECHNICAL SERVICES

X-ray Diffraction Laboratory

An X-ray diffraction laboratory and XRD service for structural and microstructural characterization of crystalline materials, powders, thin films and functional materials.

Structural information for crystalline materials

The X-ray Diffraction Laboratory is a consolidated ICMAB scientific service. Its main objective is to support the different departments of the institute while also being available to external scientific users.

Based on X-ray diffraction principles, the service provides structural and microstructural information about crystalline materials. In materials science, understanding structure and composition is essential for interpreting properties and performance.

The XRD service offers fast, accurate and customised data collection, qualitative and quantitative phase analysis, texture measurements, residual stress, reciprocal space maps, microdiffraction and thin film diffraction.

Main XRD capabilities

A scientific platform for X-ray diffraction data acquisition and analysis under multiple geometries, sample formats and experimental conditions.

Powder diffraction

Standard powder diffraction, qualitative and quantitative phase analysis for crystalline materials.

Thin films

Thin film diffraction, X-ray reflectometry, grazing incidence diffraction and reciprocal space maps.

Texture & stress

Texture measurements, pole figures, residual stress analysis and microstructural characterization.

Microdiffraction

Microdiffraction, X-Y mapping, capillary measurements and customized XRD data collection.

Laboratory environment

The original XRD slideshow is preserved as a visual overview of the laboratory equipment and working environment.

SCIENTIFIC & TECHNICAL SERVICES

X-ray Diffraction Laboratory

SCIENTIFIC & TECHNICAL SERVICES

X-ray Diffraction Laboratory

SCIENTIFIC & TECHNICAL SERVICES

X-ray Diffraction Laboratory

SCIENTIFIC & TECHNICAL SERVICES

X-ray Diffraction Laboratory

SCIENTIFIC & TECHNICAL SERVICES

X-ray Diffraction Laboratory

Diffractometers and measurement configurations

The laboratory includes Bruker X-ray diffraction instruments for powder diffraction, thin film analysis, high-resolution diffraction, capillary measurements, microdiffraction, texture and stress analysis.

Bruker D8 Advance A25 Powder

The Bruker D8 Advance A25 Powder a powder diffractometer well suited for the analysis of powder samples and qualitative analysis.

The specifications of this diffractometer are:

  • Cu radiation tube
  • Dynamic beam optimization (DBO)
  • Sample autochanger for 90 samples
  • Lynxeye XE-T detector

The applications for this diffractometer are:

  • Standard powder diffraction

Bruker D8 Advance (GADDS)

This unit is equipped with a centric Eulerian cradle and a VANTEC-500 area detector. This combination gives the Bruker D8 the capability to handle tasks such as phase identification and quantification, textural and residual stress analysis, determination of particle size, percent crystallinity, and structural identification.

It has these specifications:

  • Cu radiaton tube
  • Göbel Mirror
  • Collimator (0,5 mm, 0,3 mm, 0,1 mm)
  • XYZ stage
  • Vantec 500 Area Detector.

The applications for this diffractometer are:

  • Standard Microdiffraction analysis
  • Stress analysis
  • Texture analysis
  • X-Y mapping of flat samples

Bruker D8-Discover

The D8 DISCOVER is an X-ray diffraction instrument, perfect for thin film application, equipped with four motorized axes stage, having as typical applications: XR Reflectometry, Rocking measurements, RSM measurements and structural phase identification. The equipment can works in two differents configurations, Bragg-Brentano and Parallel configuration. 

The specifications of this diffractometer are:

  • Centric Eulerian Cradle
  • Twin Cu radiaton tube (lineal or point beam)
  • Göbel Mirror 600mm length
  • 2-Bounce monochromator Acc2 (Ge022) primary monochromator
  • Knife Edge Collimator 
  • Lynxeye XE-T Detector
  • Pathfinder 1-Bounce (Ge022) secondary monochromator with scintillation dectector
  • XYZ stage
  • Tilt Stage with Xi Zeta angles

The applications for this difractometer are:

  • High-resolution X-ray diffraction
  • X-ray reflectometry
  • Grazing incidence diffraction (GID)
  • Stress analysis
  • Texture analysis
  • X-Y mapping of flat samples
  • Standard powder diffraction

Bruker D8 Advance A25

The D8 Advance A25 is equipped by two different configurations, Bragg-Brentano geometry with electrochemical cell (Cu radiation) and Debye-Scherrer geometry (Mo radiation) with a Johansson monochromator for capillary measurements.

The specifications are:

  • Cu radiation tube for electro-chemical cell
  • Mo radiaton tube for capillary
  • Johanson primary monochromator for Mo radiation
  • Electro-chemical cell
  • Lynxeye XE-T detector
  • Capillary sample stage
  • Powder sample stage
  • Powder mutliple sample

The applications for this diffractometer are:

  • Standar powder diffraction
  • Capillary diffraction
  • Transmission standard diffraction

XRD analysis software

Specialised software supports phase identification, quantitative phase analysis, structure analysis, texture analysis, thin film analysis and residual stress studies.

Powder diffraction software

EVA – Phase identification and quantitative phase analysis
TOPAS – Profile analysis, quantitative analysis and structure analysis

Materials research software

MULTEX – Texture analysis
LEPTOS – Thin film analysis and residual stress

Request Service

To request XRD measurements, download and complete the service request sheet. The service team can help define the most suitable configuration according to sample type, geometry and scientific question.

1

Request
Download and complete the XRD request form.

2

Sample
Define sample type, geometry and measurement needs.

3

Configuration
Select suitable diffractometer and setup.

4

Measurement
Collect X-ray diffraction data under required conditions.

5

Analysis
Receive data, phase analysis or technical feedback.

X-ray Diffraction Laboratory team

Technical staff and scientists in charge supporting XRD data collection, analysis and materials characterization workflows.

Technicians


Scientists in charge

Contact X-ray Diffraction Laboratory

ICMAB
Campus UAB
In front of Firehouse
08193 Bellaterra
Barcelona, Spain

E-mail

Phone