X-ray Diffraction Laboratory
An X-ray diffraction laboratory and XRD service for structural and microstructural characterization of crystalline materials, powders, thin films and functional materials.
Structural information for crystalline materials
The X-ray Diffraction Laboratory is a consolidated ICMAB scientific service. Its main objective is to support the different departments of the institute while also being available to external scientific users.
Based on X-ray diffraction principles, the service provides structural and microstructural information about crystalline materials. In materials science, understanding structure and composition is essential for interpreting properties and performance.
The XRD service offers fast, accurate and customised data collection, qualitative and quantitative phase analysis, texture measurements, residual stress, reciprocal space maps, microdiffraction and thin film diffraction.
Main XRD capabilities
A scientific platform for X-ray diffraction data acquisition and analysis under multiple geometries, sample formats and experimental conditions.
Powder diffraction
Thin films
Texture & stress
Microdiffraction
Laboratory environment
The original XRD slideshow is preserved as a visual overview of the laboratory equipment and working environment.
X-ray Diffraction Laboratory
X-ray Diffraction Laboratory
X-ray Diffraction Laboratory
X-ray Diffraction Laboratory
X-ray Diffraction Laboratory
Diffractometers and measurement configurations
The laboratory includes Bruker X-ray diffraction instruments for powder diffraction, thin film analysis, high-resolution diffraction, capillary measurements, microdiffraction, texture and stress analysis.
Bruker D8 Advance A25 Powder
The Bruker D8 Advance A25 Powder a powder diffractometer well suited for the analysis of powder samples and qualitative analysis.
The specifications of this diffractometer are:
- Cu radiation tube
- Dynamic beam optimization (DBO)
- Sample autochanger for 90 samples
- Lynxeye XE-T detector
The applications for this diffractometer are:
- Standard powder diffraction
Bruker D8 Advance (GADDS)
This unit is equipped with a centric Eulerian cradle and a VANTEC-500 area detector. This combination gives the Bruker D8 the capability to handle tasks such as phase identification and quantification, textural and residual stress analysis, determination of particle size, percent crystallinity, and structural identification.
It has these specifications:
- Cu radiaton tube
- Göbel Mirror
- Collimator (0,5 mm, 0,3 mm, 0,1 mm)
- XYZ stage
- Vantec 500 Area Detector.
The applications for this diffractometer are:
- Standard Microdiffraction analysis
- Stress analysis
- Texture analysis
- X-Y mapping of flat samples
Bruker D8-Discover
The D8 DISCOVER is an X-ray diffraction instrument, perfect for thin film application, equipped with four motorized axes stage, having as typical applications: XR Reflectometry, Rocking measurements, RSM measurements and structural phase identification. The equipment can works in two differents configurations, Bragg-Brentano and Parallel configuration.
The specifications of this diffractometer are:
- Centric Eulerian Cradle
- Twin Cu radiaton tube (lineal or point beam)
- Göbel Mirror 600mm length
- 2-Bounce monochromator Acc2 (Ge022) primary monochromator
- Knife Edge Collimator
- Lynxeye XE-T Detector
- Pathfinder 1-Bounce (Ge022) secondary monochromator with scintillation dectector
- XYZ stage
- Tilt Stage with Xi Zeta angles
The applications for this difractometer are:
- High-resolution X-ray diffraction
- X-ray reflectometry
- Grazing incidence diffraction (GID)
- Stress analysis
- Texture analysis
- X-Y mapping of flat samples
- Standard powder diffraction
Bruker D8 Advance A25
The D8 Advance A25 is equipped by two different configurations, Bragg-Brentano geometry with electrochemical cell (Cu radiation) and Debye-Scherrer geometry (Mo radiation) with a Johansson monochromator for capillary measurements.
The specifications are:
- Cu radiation tube for electro-chemical cell
- Mo radiaton tube for capillary
- Johanson primary monochromator for Mo radiation
- Electro-chemical cell
- Lynxeye XE-T detector
- Capillary sample stage
- Powder sample stage
- Powder mutliple sample
The applications for this diffractometer are:
- Standar powder diffraction
- Capillary diffraction
- Transmission standard diffraction
XRD analysis software
Specialised software supports phase identification, quantitative phase analysis, structure analysis, texture analysis, thin film analysis and residual stress studies.
Powder diffraction software
TOPAS – Profile analysis, quantitative analysis and structure analysis
Materials research software
LEPTOS – Thin film analysis and residual stress
Request Service
To request XRD measurements, download and complete the service request sheet. The service team can help define the most suitable configuration according to sample type, geometry and scientific question.
1
Download and complete the XRD request form.
2
Define sample type, geometry and measurement needs.
3
Select suitable diffractometer and setup.
4
Collect X-ray diffraction data under required conditions.
5
Receive data, phase analysis or technical feedback.
X-ray Diffraction Laboratory team
Technical staff and scientists in charge supporting XRD data collection, analysis and materials characterization workflows.
Technicians
Scientists in charge
Contact X-ray Diffraction Laboratory
ICMAB
Campus UAB
In front of Firehouse
08193 Bellaterra
Barcelona, Spain
Phone
ICMAB - X-ray Diffraction Laboratory
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