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Industry & Transfer / Services for Companies

Scanning Probe Microscopy

Nanoscale surface, electrical, magnetic and electromechanical characterization.

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All characterization services

What this service offers

Scanning probe microscopy maps local surface and functional properties at the nanoscale, supporting the study of thin films, nanostructures and devices.

Companies can access established measurements with technical support, data processing and, when requested, interpretation or technical reporting.

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What this service can tell you

Use these information areas to assess whether the service matches your material question.

Surface structure

4 information areas
  • Surface topography
  • Roughness and height profiles
  • Grain structure and domains
  • Local defects and surface organisation

Mechanical and electrical response

4 information areas
  • Friction and mechanical contrast
  • Surface electrical potential
  • Electrostatic properties
  • Ferroelectric and piezoelectric response

Magnetic and device properties

2 information areas
  • Local magnetic properties
  • Localised properties of thin films, nanostructures and devices

Techniques and service routes

The service uses the following established techniques or technical routes, selected according to the sample and information required.

Available options

  • Atomic force microscopy (AFM)
  • Friction-force microscopy
  • Electrostatic-force microscopy
  • Kelvin-probe microscopy
  • Piezoresponse microscopy
  • Magnetic-force microscopy
  • Dynamic topography
  • Scanning tunnelling microscopy

From measurement to a usable result

Technical consultation

Before measurement

Align the sample, technique and information need.

Measurement data

Core output

Receive data generated with the agreed service route.

Data processing

Result preparation

Process and organise the data for technical assessment.

Interpretation or report

When requested

Add interpretation or technical reporting where included in the scope.

An established technical service

This page describes access to existing techniques and infrastructure within the ICMAB Scientific and Technical Services.

Need a custom experimental programme?

New methods, customised programmes, in-situ or operando measurements, device development and advanced scientific interpretation beyond the standard service should be discussed as contract research or collaboration with an ICMAB research group.

Discuss your scanning probe microscopy request

Describe your material, sample format, the information you need and any relevant measurement constraints so the technical team can assess the request.

Request Scanning Probe Microscopy
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