Phase, crystal structure, texture, stress and thin-film analysis.
X-ray diffraction provides structural information for powders, films, layers and capillary samples, from phase identification to advanced reciprocal-space studies.
Companies can access established measurements with technical support, data processing and, when requested, interpretation or technical reporting.
Use these information areas to assess whether the service matches your material question.
The service uses the following established techniques or technical routes, selected according to the sample and information required.
Align the sample, technique and information need.
Receive data generated with the agreed service route.
Process and organise the data for technical assessment.
Add interpretation or technical reporting where included in the scope.
This page describes access to existing techniques and infrastructure within the ICMAB Scientific and Technical Services.
New methods, customised programmes, in-situ or operando measurements, device development and advanced scientific interpretation beyond the standard service should be discussed as contract research or collaboration with an ICMAB research group.
Surface morphology, microstructure and elemental composition for advanced materials.
Nanostructural imaging, electron diffraction and elemental microanalysis.
Fabrication of complex oxide, metal and oxide–metal thin-film structures.
Describe your material, sample format, the information you need and any relevant measurement constraints so the technical team can assess the request.
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